Why Precise Nanoscale Sampling Matters

In cutting-edge fields like materials science, life sciences, and semiconductor device research, precision sampling at the nanoscale is often a prerequisite for meaningful results. Whether it's extracting a specific failure site from a semiconductor die or isolating organelles from a single cell, conventional sampling methods often fall short, lacking the resolution, accuracy, and environmental control needed for high-sensitivity analysis.

This is where advanced FIB-SEM (Focused Ion Beam Scanning Electron Microscopy) systems come in, especially those equipped with an integrated nanomanipulator. Among these, the CIQTEK Dual Beam SEM DB550 stands out for its high-resolution imaging, picometer-level manipulation accuracy, and seamless integration of sample preparation, lift-out, and analysis tools.

 

How the CIQTEK DB550 Elevates Nanoscale Sample Handling

1. High-Resolution SEM Imaging for Target Site Identification

The CIQTEK FIB-SEM DB550’s field emission electron column delivers exceptional imaging clarity, achieving up to 0.9 nm resolution at 15 kV, ideal for resolving intricate microstructures. This high-resolution SEM capability allows researchers to visually navigate complex surfaces and precisely locate regions of interest, be it nanoscale particles in a composite, organelles within cells, or structural defects in advanced nodes of semiconductor failure analysis.

 

2. Integrated Nanomanipulator for Picometer-Level Precision

The nanomanipulator integrated into DB550 offers 3D control with picometer-scale positioning accuracy, making it ideal for site-specific sample preparation. It enables researchers to approach, grip, and lift-out micro- and nano-sized features with remarkable control. For instance, the nanomanipulator can delicately extract a specific nanowire from a dense network or isolate a membrane region in biological samples, all while minimizing mechanical stress.

This feature is particularly valuable for workflows like:

  • TEM sample lift-out from semiconductor devices
  • Nano-probing for electrical testing
  • Sample isolation for single-cell omics

 

3. Maximizing Sample Integrity During Transfer

One of the challenges in nanoscale sampling is preserving the original structure and chemistry of the specimen. The DB550 addresses this through:

  • Dynamic force control, preventing deformation or breakage during manipulation
  • Cleanroom-grade vacuum and anti-contamination protocols, protecting the sample from environmental exposure

This ensures low-damage nano-extraction, which is critical for downstream EDS (Energy Dispersive X-ray Spectroscopy), EBSD, or TEM analysis.

 

4. Seamless Workflow with Dual Beam Functionality

The synergy of focused ion beam and electron beam in the DB550 allows for a complete sampling and analysis pipeline:

  • FIB milling can preprocess the sample site and remove surface contaminants or cut trenches
  • Nanomanipulator then lifts out the precise section
  • In-situ SEM or EDS analysis can be immediately performed for real-time verification

This one-stop nanoscale manipulation platform significantly enhances efficiency while maintaining data fidelity.

 

Why CIQTEK DB550 is Ideal for Advanced Nanomanipulation

Technology independence: CIQTEK’s proprietary core technologies offer performance on par with world-leading brands, at a more competitive price point

Workflow integration: From focused ion beam milling to sample lift-out, the DB550 supports in-situ manipulation and imaging, reducing the need for external systems

User-centric design: Fully localized software, intuitive navigation, and automation options enhance accessibility for new and experienced users alike

CIQTEK FIB-SEM

Whether you're preparing site-specific lamellae for TEM, isolating features from biological tissue, or performing complex nanomanipulation in electron microscopy, the DB550 offers a powerful and versatile solution. It’s not just a tool. It’s a nanoscale sampling ecosystem designed to keep your research on the cutting edge.

Explore how the CIQTEK DB550 Dual Beam FIB-SEM can optimize your nanoengineering workflows: from precise lift-out to clean sample extraction and real-time analysis.