Under the CIQTEK Scanning Electron Microscope, we can observe the fine textile structure of lizard skin cells, which allows for a visual examination of the structural characteristics of crystalline plates in the skin, such as their size, length, and arrangement. These images not only provide a visual feast but also offer crucial clues for scientists to interpret material properties, disease mechanisms, and biological tissue functions.

Figures1. Ultrastructure of lizard skin/30 kV/STEM

In the field of electron science, SEM helps engineers examine tiny solder joints and conductors on circuit boards in detail to ensure the precision and reliability of technology. In materials science, SEM can be used to analyze fracture surfaces of metal alloys, optimizing industrial design and processing technology. In biological applications, SEM can display the surface structure of bacteria and even observe interactions between viruses and host cells.

Figures2. SEM3200/Ordinary chip2/10 kV/ETD

SEM is not just a machine; it is more like a meticulous detective that helps us uncover the microscopic secrets in nature and man-made objects, providing strong support for scientific research and technological innovation. Through SEM, scientists can better understand the nature of materials, the structure of biological tissues, and the essence of various complex phenomena, pushing the boundaries of our knowledge forward.

Common Misconceptions about SEM:

1. Are SEM images in true colors?

SEM produces black and white images because they result from the interaction of electrons with the specimen, not from light waves. The colored SEM images typically seen are post-processed using digital coloring techniques to distinguish different structures or enhance visual effects.

2. Is higher magnification always better?

While SEM can provide extremely high magnification, not all research requires maximum magnification. Excessive magnification beyond the specimen's feature scale not only increases scanning time but may also lead to an increase in irrelevant information.

3. Can SEM see atoms?

Although SEM offers high resolution, it often cannot reach the level of observing individual atoms. To observe structures at the atomic scale, transmission electron microscopes (TEM) or scanning tunneling microscopes (STM) are typically needed.

4. Is SEM only suitable for solid and lifeless specimens?

While SEM was initially designed for solid materials, modern techniques allow observation of biological specimens as well. Through specific specimen treatments such as freezing, drying, or coating with conductive materials, SEM can also be used to observe biological tissues and cells.

5. Can SEM images fully represent the actual conditions of a specimen?

SEM images are two-dimensional projections obtained from specific angles and parameters, which may not fully reveal the three-dimensional structure and true conditions of the specimen. Additionally, the specimen preparation process may cause deformations or artifacts that can affect the accuracy of the results.

Professor Yan Yu's team at USTC utilized the CIQTEK Scanning Electron Microscope SEM3200 to study the post-cycling morphology. It developed amorphous carbon with controllable defects as a candidate material for an artificial interface layer balancing potassiophilicity and catalytic activity.

The research team prepared a series of carbon materials with different degrees of defects (designated as SC-X, where X represents the carbonization temperature) by regulating the carbonization temperature. The study found that SC-800 with excessive defects caused substantial electrolyte decomposition, resulting in an uneven SEI film and shortened cycle life. SC-2300, with the fewest defects, had insufficient affinity for potassium and easily induced potassium dendritic growth. SC-1600, which possessed a locally ordered carbon layer, exhibited an optimized defect structure, achieving the best balance between potassiophilicity and catalytic activity. It could regulate the electrolyte decomposition and form a dense and uniform SEI film.

The experimental results demonstrated that SC-1600@K exhibited long-term cycle stability for up to 2000 hours under a current density of 0.5 mA cm-2 and a capacity of 0.5 mAh cm-2. Even under higher current density (1 mA cm-2) and capacity (1 mAh cm-2), it maintained excellent electrochemical performance with stable cycles exceeding 1300 hours. In full-cell testing, when paired with a PTCDA positive electrode, it maintained 78% capacity retention after 1500 cycles at a current density of 1 A/g, demonstrating outstanding cycle stability.

This research, titled "Balancing Potassiophilicity and Catalytic Activity of Artificial Interface Layer for Dendrite-Free Sodium/Potassium Metal Batteries," was published in Advanced Materials.

Figure 1: The microstructure analysis results of carbon samples (SC-800, SC-1600, and SC-2300) prepared at different carbonization temperatures are presented. Through techniques such as X-ray diffraction (XRD), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), and wide-angle X-ray scattering (WAXS), the crystal structure, defect level, and oxygen and nitrogen doping of these samples were analyzed. The results showed that as the carbonization temperature increased, the defects in the carbon materials gradually decreased, and the crystal structure became more orderly.

Figure 2: The current density distribution during potassium metal growth on different composite negative electrodes was analyzed using finite element simulation. The simulation results showed that the SC-1600@K composite electrode exhibited a uniform current distribution during potassium deposition, which helped suppress dendritic growth effectively. Additionally, the Young's modulus of the SEI layer was measured using atomic force microscopy (AFM), and the results showed that the SEI layer on the SC-1600@K electrode had a higher modulus, indicating its stronger firmness and inhibition of dendritic formation.

Figure 3: The electrochemical performance of different composite electrodes (SC-800@K, SC-1600@K, and SC-2300@K) in symmetrical cells is presented. The SC-1600@K electrode exhibited excellent cycle stability and low overpotential at different current densities and capacities. Furthermore, electrochemical impedance spectroscopy (EIS) and Sand's time testing further confirmed the advantages of the SC-1600@K electrode in suppressing dendritic growth and maintaining SEI layer stability.

Figure 4: The structure and composition of the SEI layer on different composite negative electrodes were analyzed using cryogenic transmission electron microscopy (Cryo-TEM) and time-of-flight secondary ion mass spectrometry (ToF-SIMS). The results showed that the SC-1600@K electrode had a uniform, thin, and inorganic-rich SEI layer, facilitating fast potassium ion transport kinetics and high Young's modulus. The SEI layers on the SC-800@K and SC-2300@K electrodes exhibited thicker and organic-rich characteristics.

Figure 5: The effects of defect configuration in the carbon layer on potassium ion deposition and SEI formation were explored using density functional theory (DFT) calculations. The results showed that an appropriate amount of defects could enhance the interaction between potassium ions and the carbon layer, reducing the nucleation overpotential, while excessive defects could lead to excessive electrolyte decomposition.

Figure 6: The electrochemical performance of a full cell (PTCDA//SC-1600@K) assembled using the SC-1600@K electrode is presented. This cell exhibited excellent rate performance and long-term cycle stability at different current densities, demonstrating the potential of the SC-1600@K electrode in practical battery applications.

In conclusion, the research team successfully designed and prepared a carbon material (SC-1600) with a locally ordered structure, serving as an artificial interface layer for sodium/potassium metal battery negative electrodes. By precisely controlling the defect content of the material, the team achieved the optimal balance between potassiophilicity and catalytic activity, significantly improving the uniform deposition of potassium ions and promoting the formation of a stable SEI layer. In a potassium symmetrical cell based on SC-1600 in a carbonate electrolyte system, SC-1600@K exhibited excellent cycle stability with a cycle life exceeding 2000 hours. Notably, a full cell assembled with the SC-1600@K negative electrode and PTCDA positive electrode maintained 78% capacity retention after 1500 cycles at a high current density of 1 A/g. This research not only established a model system for optimizing the SEI structure and potassium ion adsorption by controlling the interfacial layer defects but also provided important theoretical guidance and a technological pathway for the rational design of protective interfacial layers in potassium metal batteries.

Electron Backscatter Diffraction (EBSD) is a widely used microscopy technique in material science. It analyzes the angles and phase differences of the backscattered electrons produced when a sample interacts with a high-energy electron beam to determine key characteristics such as crystal structure and grain orientation. Compared to a traditional Scanning Electron Microscope (SEM), EBSD provides higher spatial resolution and can obtain crystallographic data at the sub-micrometer level, offering unprecedented details for analyzing material microstructures.

Characteristics of the EBSD Technique

EBSD combines the microanalysis capabilities of Transmission Electron Microscope (TEM) and the large-area statistical analysis capabilities of X-ray diffraction. EBSD is known for its high-precision crystal structure analysis, fast data processing, simple sample preparation process, and the ability to combine crystallographic information with microstructural morphology in material science research. SEM equipped with an EBSD system not only provides micro-morphology and composition information but also enables microscopic orientation analysis, greatly facilitating the work of researchers.

Application of EBSD in SEM

In SEM, when an electron beam interacts with the sample, various effects are generated, including the diffraction of electrons on regularly arranged crystal lattice planes. These diffractions form a "Kikuchi pattern," which not only contains information about the symmetry of the crystal system but also directly corresponds to the angle between crystal planes and crystallographic axes, with a direct relationship to the crystal system type and lattice parameters. This data can be used to identify crystal phases using the EBSD technique, and for known crystal phases, the orientation of the Kikuchi pattern directly corresponds to the orientation of the crystal.

EBSD System Components

To perform EBSD analysis, a set of equipment including a Scanning Electron Microscope and an EBSD system is required. The core of the system is the SEM, which produces a high-energy electron beam and focuses it on the sample surface. The hardware part of the EBSD system usually includes a sensitive CCD camera and an image processing system. The CCD camera is used to capture the backscattered electron images, and the image processing system is used to perform pattern averaging and background subtraction to extract clear Kikuchi patterns.

Operation of the EBSD Detector

Obtaining EBSD Kikuchi patterns in SEM is relatively simple. The sample is tilted at a high angle relative to the incident electron beam to enhance the backscattered signal, which is then received by a fluorescent screen connected to a CCD camera. The EBSD can be observed directly or after amplification and storage of the images. Software programs can calibrate the patterns to obtain crystallographic information. Modern EBSD systems can achieve high-speed measurements and can be used in conjunction with Energy-Dispersive X-ray Spectroscopy (EDS) probes to perform compositional analysis while rapidly obtaining sample orientation information.

Sample Preparation Principles

For effective EBSD analysis, sample preparation needs to follow certain principles, including the absence of residual stress, a flat surface (mechanical polishing), cleanliness, suitable shape and size, and good conductivity. The sample preparation process may involve ion etching, polishing, and other steps to ensure that the sample surface is suitable for EBSD analysis.

EBSD Calibration and Surface Scanning

Calibration is a critical step in the EBSD analysis process, ensuring an accurate correspondence between the Kikuchi patterns and crystallographic parameters. Surface scanning is another important application of EBSD technology, allowing researchers to perform extensive crystallographic analysis on the sample surface, thereby obtaining a comprehensive view of the material's microstructure.

The 7th International Conference of the Asian Union of Magnetic Societies (IcAUMS) will be held at the Okinawa Convention Center in Japan from April 21st to 25th. CIQTEK, with its independently developed Scanning NV Probe Microscope (SNVM), will showcase innovative achievements in the field of extremely weak magnetic fields. We sincerely invite experts and teachers attending the conference to visit CIQTEK's booth, experience the charm of cutting-edge technology, explore cooperation opportunities, and jointly promote advances in magnetism and related disciplines.

The Asian Union of Magnetic Societies International Conference is held once every two years. Since its establishment in 2008 by magnetic societies from China, Japan, Korea, and Taiwan, it has become an important platform for exchanges in the field of magnetism and magnetic materials in the Asia-Pacific region.

The conference aims to promote in-depth cooperation in this field and enhance the influence of the Asia-Pacific region in the global field of magnetism and magnetic materials. At that time, experts, scholars, and representatives from companies from all over the world will gather together to discuss cutting-edge scientific research in magnetism, the latest research achievements, and future development trends.

CIQTEK's SNVM, developed for scanning NV probe microscopy, utilizes nitrogen-vacancy (NV) color centers in diamond as the core sensing element. Through quantum coherent manipulation, it achieves ultra-high detection sensitivity at the single-nuclear-spin level. Compared to traditional magnetic imaging devices, it breaks through the sensitivity and resolution limitations of traditional techniques in the detection of weak electric/magnetic fields. The single-atom-sized sensor greatly enhances spatial resolution and enables high-precision electromagnetic imaging and spectroscopic analysis at the nanoscale, providing a powerful microscopic detection tool for multidisciplinary research.

CIQTEK focuses on core technologies in precision measurement and is deeply involved in the development of high-end scientific instruments. Its main business covers providing key devices and equipment for multiple industries. In 2023, CIQTEK developed the low-temperature version of SNVM for the first time globally. It can measure the electromagnetic properties of materials in the temperature range of 2 to 300 K and, when paired with a three-axis vector magnet, greatly expands the application scenarios of SNVM.

Currently, more than ten units of this product have been successfully delivered, with users including Peking University, Tsinghua University, the Institute of Physics, Chinese Academy of Sciences, and City University of Hong Kong, among other top research institutions.

Focused Ion Beam (FIB) technology has become an essential part of modern technological advancements, particularly in semiconductor manufacturing and nanofabrication. While FIB technology is well-known, its history and development are not widely known. Focused Ion Beam (FIB) is a micro-cutting instrument that uses electromagnetic lenses to focus an ion beam into a very small area. FIB involves accelerating ions from an ion source (most FIBs use Ga, but some devices have He and Ne ion sources) and then focusing the beam onto the surface of the sample.

CIQTEK DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) 

Origin of FIB Technology

Since the 20th century, nanotechnology has rapidly developed as an emerging field in science and technology. Currently, nanotechnology represents one of the forefront areas of scientific and technological advancement and has significant implications for economic and social development as a national strategy. Nanostructures have unique properties due to their structural units approaching the coherence length of electrons and the wavelength of light, leading to surface and interfacial effects, size effects, and quantum size effects. They exhibit many novel characteristics in electronics, magnetism, optics, and mechanics, and hold enormous potential in high-performance device applications. The development of novel nanoscale structures and devices requires the advancement of precise, multidimensional, and stable micro-nanofabrication techniques. Micro-nanofabrication processes are extensive and commonly involve techniques such as ion implantation, photolithography, etching, and thin film deposition. In recent years, with the trend of miniaturization in modern manufacturing processes, Focused Ion Beam (FIB) technology has increasingly been applied in fabricating micro-nano structures in various fields, becoming an indispensable and important technique in micro-nanofabrication.

FIB technology is developed based on conventional ion beam and focused electron beam systems and is essentially the same. Compared to electron beams, FIB scans the sample surface using an ion beam generated by an ion source after acceleration and focusing. Since ions have much greater mass than electrons, even the lightest ions, such as H+ ions, are more than 1800 times the mass of electrons. This enables the ion beam to not only achieve imaging and exposure capabilities similar to electron beams but also utilize the ion's heavy mass to sputter atoms from solid surfaces, making it a direct processing tool. FIB can also induce atoms to deposit onto the sample material surface by combining with chemical gases. Therefore, FIB is a widely applicable tool in micro-nanofabrication.

Development of Ion Sources

In the development of FIB technology, the advancement of high-brightness ion sources has been crucial. Early gas ion sources and Liquid Metal Ion Sources (LMIS) laid the foundation for FIB technology. In 1974, Seliger and Fleming first used a gas ion source for maskless ion implantation and resist exposure, confirming the potential of this technology. Subsequently, Orloff and Swanson developed the gas field ion source, which had high resolution but limited industrial application due to the requirement of low temperatures. The Liquid Metal Ion Source, on the other hand, was more successful due to its high ion brightness and ease of operation, laying the foundation for modern FIB systems based on Ga LMIS.

Applications of FIB Technology

FIB technology finds a wide range of applications, including ion implantation, milling, surface chemistry, lithography, materials micro-analysis, and scanning ion microscopy. In 1987, J. Melngailis published a comprehensive review of FIB applications, highlighting the potential of FIB technology in multiple fields.

EPR (Electron Paramagnetic Resonance) spectroscopy remains indispensable in cutting-edge research from energy storage to bio-radical chemistry. As more UK labs seek instruments that balance performance, usability, and cost, a new player is making a strong impression across Europe: CIQTEK. Here’s why more researchers are turning to CIQTEK’s EPR solutions — and what makes them stand out.

Meeting the Needs of Modern UK Research Labs

Whether in leading research‑intensive universities or smaller independent research centers, EPR users today want more than just raw sensitivity — they value flexibility, service, and return on investment. UK labs, in particular, are balancing world-class ambitions with careful budgeting and time pressure. This is where CIQTEK EPR systems have found a clear niche.

In recent European demos and trials — including installations in France and on-site testing in the UK — researchers have noted how CIQTEK’s compact design and easy-to-learn software enable quicker start-up, less training, and smooth integration with existing workflows.

Performance Where It Counts: Compact Yet Capable

CIQTEK Benchtop EPR EPR200M may look small, but it delivers capabilities well beyond expectations:

• X-band continuous wave with high modulation depth and stable magnetic field control

• Integrated temperature control (VT) without bulky external cryostats

• Optimized for paramagnetic centers, metal complexes, and free radical detection

Meanwhile, the CW/Pulse EPR (EPR300/EPR100) system offers advanced time-resolved measurements for researchers diving into spin dynamics or exploring transient species, all within a streamlined, fully integrated setup.

Researchers at a UK materials science lab recently commented during a demo:

“We were surprised that a system this compact could generate clean spectra at cryogenic temperatures, with so little prep time. It’s exactly what we needed for fast, routine spin checks.”

CIQTEK EPR Workshop

Cost-Effective Without Compromise

Traditional high-end EPR systems can stretch lab budgets thin. CIQTEK offers an attractive alternative with:

• Transparent pricing and flexible configurations

• Low operational overheads (built-in accessories, minimal consumables)

• All-in-one systems that reduce space and utility costs

For institutions with multiple research teams or shared facilities, CIQTEK’s modular EPR platforms allow more users to benefit without requiring additional infrastructure.

Local Support and Global Standards

CIQTEK’s growing footprint in the UK is supported by local partnerships for installation, training, and fast-response service, addressing a common pain point for many UK labs working with overseas suppliers.

European researchers who've adopted CIQTEK systems have praised the speed of onboarding and the clarity of support documentation. Whether it’s remote software guidance or on-site calibration, users report a refreshingly responsive experience.

The Smart Choice for a Smarter Lab

If your lab is considering a new EPR system — or upgrading from a legacy model — now is the time to explore options that bring efficiency, innovation, and reliability together. CIQTEK’s EPR line is designed not just to meet technical demands but to support your team’s productivity from day one.

It is with great pleasure that we, CIQTEK, announce an attendance at a workshop dedicated to Aqueous Organic Redox Flow Batteries, to be held in the Campus des Cordeliers at Sorbonne University (Paris, France) on April 24-25, 2025. We will also bring the Electron Paramagnetic Resonance (EPR) Spectrometer-related materials to have friendly exchanges with scientists and researchers from all walks of life.

The workshop aims to bring together the whole community working on Aqueous Organic Redox Flow Batteries, at various research and development stages from fundamental research to prototypes.

The first edition will focus on best practices for determining performance metrics, including capacity, energy, and power, during the early development stages of new chemistries. It will also address methodologies to assess the stability of organic redox active materials, considering degradation mechanisms and projected lifetimes.

The workshop will also cover methodologies and techniques for accurately determining SOC and SOH, recommended procedures for conducting accelerated aging tests, predictive tools for assessing the long-term stability and performance of the RFB, and challenges to be addressed when scaling up AORFB technologies from laboratory-scale experiments to larger industrial applications. Looking forward to seeing you in Paris!

Meet us at the Workshop

Date: April 24 - 25, 2025

Location: Sorbonne University, Paris, France

CIQTEK participated in the prestigious Experimental NMR Conference (ENC) 2025 ENC-ISMAR Joint Conference, held from April 6 to 10 in Pacific Grove, California. The conference served as an excellent platform for CIQTEK to showcase its cutting-edge research and advancements in single-molecule magnetic resonance and its wide-ranging applications.

During the event, CIQTEK's renowned experts, including the Vice President, Chief Engineer, and Overseas Division Head, presented a keynote lecture on the groundbreaking topic of "single-molecule magnetic resonance and applications." The presentation highlighted the company's pioneering work in leveraging NMR techniques to analyze and study individual molecules, revolutionizing the understanding and utilization of molecular structures in various scientific fields.

"We are honored to have had the opportunity to share our latest research and innovations in single molecule magnetic resonance at the ENC 2025 ENC-ISMAR Joint Conference," said Eric, Vice President of CIQTEK. "By unraveling the mysteries of individual molecules, we aim to unlock new insights and applications that will shape the future of scientific exploration. We look forward to continuing our contributions to the field and collaborating with esteemed professionals in driving advancements in NMR and Electron Paramagnetic Resonance technology."

Drilling Nuclear-Magnetic Resonance Logging Tool

The China International Petroleum & Petrochemical Technology and Equipment Exhibition (cippe) has established itself as a premier event in the industry, attracting key players and experts from around the world. With its extensive experience and expertise, QOILTECH is excited to join this prestigious platform and engage with industry professionals, decision-makers, and potential partners.

About QOILTECH:

QOILTECH was established in September 2020 and is a wholly-owned subsidiary of CIQTEK. Its core technology is magnetic resonance precision measurement, and it provides the energy industry with core key components, detection instruments and equipment, systematic solutions, and other products and services.

QOILTECH focuses on the utilization of unconventional oil and gas resources such as shale oil and gas, coalbed methane, and combustible ice. It has deployed instruments and equipment such as drilling nuclear magnetic resonance logging instruments, near-bit measurement systems, and high-rate pulses, and has opened up application scenarios such as downhole sensing and digital core analysis.

 QOILTECH Website: https://www.qoiltech.com/