Don't Miss Our Talk

• Session: 2026 EPR Tentative Program
• Topic: Next-Generation EPR: Combining High-Performance Q Band Instrumentation with Artificial Intelligence Enhanced Spectral Processing
• Time: Thursday, August 6, 09:30 AM
• Highlight: Learn how CIQTEK integrates high-frequency Q-Band hardware with AI algorithms to revolutionize spectral resolution and data efficiency. This presentation will showcase real-world examples of how AI-driven spectral processing can accelerate data interpretation, reduce analysis time, and unlock new insights from complex EPR spectra—empowering researchers to push the boundaries of what is possible in magnetic resonance research.

Why CIQTEK?

• On-site technical discussions with CIQTEK application specialists and service engineers
• Research solution consulting tailored to your specific scientific needs
• Live demonstrations of CIQTEK's tungsten filament SEM
• Guidance on system selection from routine imaging to advanced large-scale volume microscopy

Connect with CIQTEK in Milwaukee

Contact CIQTEK

Event Overview

CIQTEK Booth Highlights

• SEM5000X Ultra-High Resolution FESEM: CIQTEK's flagship field emission scanning electron microscope, featuring an advanced electron optical system delivering ultra-high resolution imaging, ideal for precision nano-structural analysis in materials science, semiconductors, and life sciences.
• HEM6000 High-Speed SEM: A high-throughput workstation engineered for large-area and batch inspection, with outstanding high beam current, exceptional stability, and automated workflows, significantly accelerating imaging speeds for industrial quality control and advanced research.

Company Presentation

Key Presentation Topics

• Powerful High-Speed Imaging Technology Bundle: Integrating high brightness large beam current electron source, high-speed scanning driver, high-speed electrostatic beam deflection, high-speed image processing, high-speed signal electron acquisition, high-speed video signal transmission, high-speed motion specimen stage, and highly automated workflow — delivering faster imaging speed, longer continuous imaging hours, and intelligent workflow.
• Automatic Sample Changing System: Featuring plasma cleaner functionality for efficient sample preparation and handling.
• HEM6000 Specifications: Detailed technical parameters including resolution (1.5 nm @ 1 kV SE, 1.3 nm @ 3 kV SE, 1.5 nm @ 15 kV BSE), magnification (66× – 1,000,000×), acceleration voltage (100 V – 30 kV), sample stage capabilities, and acquisition speed (10 ns/pixel, 2×100M pixels/s).
• CIQTEK Headquarter: Located at No. 1969, Kongquetai Road, High-tech Zone, Hefei, Anhui, China. The facility covers a site area of 76,000 m² with a total floor area of 280,000 m², houses over 800 employees, and includes a 4,000 m² cleanroom (Class 10,000, partially Class 100).

European Team Support

Conclusion

About CIQTEK

• CIQTEK EPR Spectrometer Family — from compact benchtop systems (EPR200M) to advanced X-Band (EPR100/EPR300), Q-Band (EPR-Q400), and ultra-high-frequency W-Band (EPR-W900) instruments, covering the full spectrum of research needs from routine analysis to cutting-edge pulsed EPR studies.
• Next-Generation Intelligent Liquid-State NMR Spectrometers — the CAN600 and CAN400, featuring high-precision digital control, wide dynamic range, automated tuning and sample handling, and an optional NMR AI assistant for a smarter, more efficient user experience.
• EPR Modernization Solutions — flexible upgrade pathways that breathe new life into legacy EPR systems, helping labs improve sensitivity and resolution while reducing cost and downtime compared to a full system replacement.

Poster Presentation: AI-Enhanced Spectral Analysis

CIQTEK also presented a poster titled "Next Generation EPR: Advanced X, Q, and W Band Instrumentation with AI Enhanced Spectral Processing," sparking engaging discussions with conference attendees on how AI-driven data processing is shaping the next generation of EPR research.

Meaningful Connections, Meaningful Science

Throughout the event, our team — including Zhiyu (Jeff) Sun, Kebiao Xu, Arvin Chen, and Stephen Su — engaged in in-depth conversations with researchers about their experimental challenges, exchanged insights on emerging trends in magnetic resonance technology, and welcomed valuable feedback from the global scientific community.

We extend our sincere thanks to the EUROMAR organizing committee and everyone who visited our booth for making this such a rewarding exchange. CIQTEK remains committed to advancing magnetic resonance technology and supporting the global research community — we look forward to our next opportunity to connect!

Event Details

• Date: June 22–26, 2026
• Location: Obernai, France (Practical sessions at nearby EPR laboratories in Strasbourg)

Improving EPR Skills Through Theory and Practice

• CW EPR fundamentals and instrumentation
• Anisotropic systems and spectral analysis strategies
• Spin trapping and computational methods
• Pulse EPR and quantification techniques
• EPR applications: Physics, Energy, and Health

CIQTEK's Contributions to the School

Tuesday, June 23 — Presentation & Online Demo

• Format: 35-minute session (15-minute presentation + 20-minute online demonstration)
• Location: Obernai
• CIQTEK will deliver a comprehensive presentation on our latest EPR technologies, followed by a live online demonstration showcasing the capabilities and applications of our advanced EPR systems.

Wednesday, June 24 — Full-Day Hands-On Practical Sessions

• Location: EPR Laboratories in Strasbourg
• Format: Full-day hands-on practical sessions
• CIQTEK Demo: EPR 200M Spectrometer
  • Duration: 60 minutes per group
  • Groups: 4 sessions
  • Participants will gain direct, hands-on experience with CIQTEK's EPR 200M spectrometer, exploring sample measurement techniques and practical applications under expert guidance.

Connecting EPR Users with Instrument Technology

Event Schedule Overview

About CIQTEK

• SEM5000X Ultra-High Resolution FESEM: CIQTEK’s flagship field emission scanning electron microscope. It features an advanced electron optical system delivering ultra-high resolution imaging, making it ideal for precision nano-structural analysis in materials science, semiconductors, and life sciences.
• HEM6000 High-Speed SEM: A high-throughput workstation engineered for large-area and batch inspection. With outstanding high beam current, exceptional stability, and automated workflows, it significantly accelerates imaging speeds for industrial quality control and advanced research.

Company Presentation

CIQTEK will present at Session 1 (Company Session LS1+MS1, Room 101A) from approximately 11:00 to 11:10.

Presenter: Miles, Solutions Specialist at CIQTEK

Topic: “Unlocking the Power of Unique High-Speed Scanning Electron Microscopy Solution from CIQTEK”

This presentation will explore the fundamental principles behind high-speed Field Emission Scanning Electron Microscopy (FESEM) and reveal how this cutting-edge technology is transforming across-scale and large-data imaging and analysis. Miles will explain what makes CIQTEK’s high-speed FESEM uniquely different and highlight the applications where it shines the most. Attendees will also learn how CIQTEK’s bundled high-speed microscopy package integrates multi-technologies to open up true bandwith, delivering breakthrough throughput whilst maintaining superb imaging resolution.

European Team Support

This exhibition is managed by CIQTEK’s European team (Frank, Miles, Markus, Changming), bringing extensive expertise in microscopy instrumentation and local market service experience to deliver professional, efficient product demonstrations and technical support. Product brochures and customized USB drives will be available for visitors. Please feel free to request them at the booth.

Visit Us

CIQTEK sincerely invites researchers, scientists, and industry partners from the global microscopy community to visit Booth II.5 and explore the latest developments and cutting-edge applications in electron microscopy technology.

Registration: Please visit https://ssl.eventilla.com/scandem2026 to register and access the latest conference schedule and detailed information.

We look forward to meeting you in Oulu, Finland!

Conference Details

Meet the DB550: One Platform for Imaging and Nanoscale Processing

The CIQTEK DB550 FIB-SEM integrates two powerful capabilities onto a single platform. On one side, a scanning electron microscope (SEM) delivers high-resolution surface imaging. On the other, a focused ion beam (FIB) performs nanoscale material removal with surgical precision. Together, they bridge the gap between observation and fabrication at dimensions measured in billionths of a meter.

At the heart of the DB550 sits a low-voltage, high-resolution electron column paired with CIQTEK's proprietary "Chengying" ion column, developed entirely in-house. The Chengying column is the engine behind the system's nanoscale cutting and etching capabilities. CIQTEK controls the full design and manufacturing pipeline for this critical component.

The 5nm Challenge: Why Sample Preparation Gets Harder at Every Node

At 5nm and below, chip architectures rely on fin-type field-effect transistors (FinFETs) with fin widths and pitches measured in just a few nanometers. The DB550 is designed to handle the full sample preparation workflow for these demanding process nodes. It starts with high-current rough cutting to quickly remove bulk material and reach the target region. Then it transitions to low-voltage fine polishing to thin the sample to TEM-ready dimensions without damaging the delicate structures underneath.

TEM Validation: The Proof Is in the Image

CIQTEK prepared a 5nm process node chip sample on the DB550 and transferred it to a TEM for characterization. The results speak for themselves.

The TEM images revealed that the fin structures remained completely intact after FIB preparation. There was no detectable amorphization in the silicon crystal lattice. The individual film layers appeared clear and sharply defined in the TEM cross-section. These results validate the dual-beam sample preparation performance of the DB550 on the most advanced process nodes.

Engineered for Reliability, Built for the Long Term

Electron microscopes are the core tool in semiconductor failure analysis labs. CIQTEK develops the DB550 from the ground up, covering the full technology stack from core hardware to underlying algorithms. The proprietary Chengying ion column, the electron optics, the stage mechanics, and the control software are all designed and optimized as an integrated system.

Owning the full design strengthens supply chain resilience. Every critical component is sourced through CIQTEK's controlled development pipeline. For semiconductor labs that depend on instrument uptime for production yield analysis and failure investigations, this predictability matters.

CIQTEK backs the DB550 with continuous, reliable, and responsive technical support. The company also provides application support to help labs develop and optimize preparation recipes for new process nodes and novel device architectures.

The SEM uses a high-resolution electron beam to capture crisp images of PCB surface morphology. It reveals solder pad plating, intermetallic compounds, micro-cracks, tin whiskers, and foreign particle contamination with exceptional clarity.

Coupled with energy-dispersive X-ray spectroscopy (EDS), the SEM also performs elemental analysis on microscopic regions. This combination lets engineers identify the chemical signature of defects, making it straightforward to spot issues like short circuits, open circuits, corrosion, and plating anomalies.

FIB Nanoscale Cutting: The "Scalpel" for Internal Structures

While the SEM excels at surface imaging, the FIB takes over when you need to see what is happening inside the board. Using a nanometer-precision ion beam, the FIB performs targeted cross-sectioning at the exact defect location. It prepares ultra-thin slices through multi-layer boards, blind vias, and buried vias, exposing internal structures that mechanical sectioning simply cannot reach.

Think of the FIB as a microscopic surgical tool. It removes material with nanometer accuracy, leaving a clean cross-section ready for imaging and analysis.

The Beauty of the Microscopic World, Revealed in Every Detail.

Here are real examples of CIQTEK electron microscopes in PCB cross-section observation:

Built for Labs That Demand Reliability

CIQTEK develops its electron microscopy platforms from the ground up, covering core algorithms through hardware design. This vertical integration ensures consistent performance and long-term supply stability, which matters for labs running continuous production or multi-year research programs.

The company backs its instruments with responsive technical support and regular software updates, helping users keep their systems running efficiently over time.

For more information about FBNL-MR 2026, including registration and the full conference program, please visit the official conference website.

U.S. & North America: info.usa@ciqtek.com International & Other Regions: info@ciqtek.com