CIQTEK, a leading global manufacturer of high-end scientific instruments, is pleased to announce its participation in the Microscopy & Microanalysis (M&M) 2026 conference, taking place August 2–6, 2026, at the Baird Center in Milwaukee, Wisconsin, USA.
The M&M conference is the largest scientific meeting and gathering of microscopy and microanalysis professionals, academics, technicians, students, and exhibitors in the world. It provides a premier forum for the presentation and discussion of a wide range of microscopy and microanalysis techniques and their application to the biological and physical sciences.
Event Details
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| Date | August 2–6, 2026 |
| Location | Baird Center, Milwaukee, WI |
| Booth Number | 718 |
Vendor Tutorial: Unlocking the Power of Unique High-Speed SEM
CIQTEK is honored to present a Vendor Tutorial at M&M 2026, featuring our latest breakthrough in scanning electron microscopy technology.
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Date: Monday, August 3, 2026
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Time: 5:45 PM – 6:45 PM
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Title: Unlocking the Power of Unique High-Speed Scanning Electron Microscopy with No Compromise of Superb Imaging Resolution at Low kV for Large Scale Volume Microscopy Applications from CIQTEK
This tutorial will demonstrate how CIQTEK's unique high-speed SEM solutions enable researchers to achieve rapid data acquisition while maintaining excellent low-kV imaging resolution — a critical capability for large-scale volume microscopy applications. Traditionally, researchers have had to choose between imaging speed and resolution; CIQTEK has eliminated this trade-off, delivering crystal-clear images at high speeds without compromising sample integrity.
Poster Presentation
CIQTEK is also pleased to share that a research abstract has been accepted for poster presentation at the conference, further demonstrating the company's commitment to advancing the frontiers of microscopy and microanalysis.
What to Expect at Booth 718
At Booth 718, the CIQTEK U.S. team will showcase our tungsten filament SEM and provide:
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On-site technical discussions with CIQTEK application specialists and service engineers
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Research solution consulting tailored to your specific scientific needs
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Live demonstrations of CIQTEK's tungsten filament SEM
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Guidance on system selection from routine imaging to advanced large-scale volume microscopy
CIQTEK's electron microscopy portfolio covers a wide range of applications, including tungsten filament SEM, high-resolution FE-SEM, FIB-SEM, and specialized high-speed SEM systems designed for volumetric electron microscopy (VEM) in both materials science and life sciences research.
Connect with CIQTEK in Milwaukee
We invite all attendees to join our Vendor Tutorial on Monday, August 3, at 5:45 PM, and to visit Booth 718 throughout the conference for detailed product information and one-on-one consultations with our technical experts.
For more information about M&M 2026, including registration and the full conference program, please visit the official conference website.
Contact CIQTEK
For meeting requests or inquiries before and during the event, please contact the CIQTEK U.S. team directly: info.usa@ciqtek.com
We look forward to connecting with you in Milwaukee and exploring how CIQTEK's advanced microscopy solutions can accelerate your research.
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