• SEM5000X Ultra-High Resolution FESEM: CIQTEK’s flagship field emission scanning electron microscope. It features an advanced electron optical system delivering ultra-high resolution imaging, making it ideal for precision nano-structural analysis in materials science, semiconductors, and life sciences.
• HEM6000 High-Speed SEM: A high-throughput workstation engineered for large-area and batch inspection. With outstanding high beam current, exceptional stability, and automated workflows, it significantly accelerates imaging speeds for industrial quality control and advanced research.

Company Presentation

CIQTEK will present at Session 1 (Company Session LS1+MS1, Room 101A) from approximately 11:00 to 11:10.

Presenter: Miles, Solutions Specialist at CIQTEK

Topic: “Unlocking the Power of Unique High-Speed Scanning Electron Microscopy Solution from CIQTEK”

This presentation will explore the fundamental principles behind high-speed Field Emission Scanning Electron Microscopy (FESEM) and reveal how this cutting-edge technology is transforming across-scale and large-data imaging and analysis. Miles will explain what makes CIQTEK’s high-speed FESEM uniquely different and highlight the applications where it shines the most. Attendees will also learn how CIQTEK’s bundled high-speed microscopy package integrates multi-technologies to open up true bandwith, delivering breakthrough throughput whilst maintaining superb imaging resolution.

European Team Support

This exhibition is managed by CIQTEK’s European team (Frank, Miles, Markus, Changming), bringing extensive expertise in microscopy instrumentation and local market service experience to deliver professional, efficient product demonstrations and technical support. Product brochures and customized USB drives will be available for visitors. Please feel free to request them at the booth.

Visit Us

CIQTEK sincerely invites researchers, scientists, and industry partners from the global microscopy community to visit Booth II.5 and explore the latest developments and cutting-edge applications in electron microscopy technology.

Registration: Please visit https://ssl.eventilla.com/scandem2026 to register and access the latest conference schedule and detailed information.

We look forward to meeting you in Oulu, Finland!

Conference Details

The SEM uses a high-resolution electron beam to capture crisp images of PCB surface morphology. It reveals solder pad plating, intermetallic compounds, micro-cracks, tin whiskers, and foreign particle contamination with exceptional clarity.

Coupled with energy-dispersive X-ray spectroscopy (EDS), the SEM also performs elemental analysis on microscopic regions. This combination lets engineers identify the chemical signature of defects, making it straightforward to spot issues like short circuits, open circuits, corrosion, and plating anomalies.

FIB Nanoscale Cutting: The "Scalpel" for Internal Structures

While the SEM excels at surface imaging, the FIB takes over when you need to see what is happening inside the board. Using a nanometer-precision ion beam, the FIB performs targeted cross-sectioning at the exact defect location. It prepares ultra-thin slices through multi-layer boards, blind vias, and buried vias, exposing internal structures that mechanical sectioning simply cannot reach.

Think of the FIB as a microscopic surgical tool. It removes material with nanometer accuracy, leaving a clean cross-section ready for imaging and analysis.

The Beauty of the Microscopic World, Revealed in Every Detail.

Here are real examples of CIQTEK electron microscopes in PCB cross-section observation:

Built for Labs That Demand Reliability

CIQTEK develops its electron microscopy platforms from the ground up, covering core algorithms through hardware design. This vertical integration ensures consistent performance and long-term supply stability, which matters for labs running continuous production or multi-year research programs.

The company backs its instruments with responsive technical support and regular software updates, helping users keep their systems running efficiently over time.

From August 24–29, 2025, CIQTEK participated in the Microscopy Conference 2025 (MC2025) held in Karlsruhe, Germany, one of Europe’s largest and most influential events in the field of electron microscopy. The conference attracted leading scientists, instrument developers, and industrial users, creating a dynamic platform for academic exchange and technological collaboration.

As part of the program, CIQTEK delivered an Exhibitor Presentation titled:
“Unlocking the Power of High-Speed Scanning Electron Microscopy — without Compromising Superb Imaging Resolution at Low kV.”

The presentation highlighted CIQTEK’s approach to enabling high-throughput SEM imaging while maintaining exceptional resolution at low accelerating voltages—a balance critical for applications in materials science, semiconductor failure analysis, and life sciences research. The talk generated considerable interest among attendees and sparked lively discussions about how advanced SEM systems can accelerate both fundamental research and industrial applications.

Beyond the presentation, the CIQTEK team actively engaged with researchers and industry professionals, sharing insights into the company’s broader electron microscopy portfolio and exploring opportunities for collaboration. These exchanges not only deepened awareness of CIQTEK’s technological strengths but also strengthened connections within the global microscopy community.

CIQTEK’s successful participation in MC2025 reflects its ongoing mission to push the boundaries of EM imaging technology and to provide researchers worldwide with powerful, accessible, and innovative solutions. Looking ahead, the company will continue to expand international partnerships and contribute to the advancement of microscopy-driven discovery.

• Electron Microscopes (TEM, SEM, FIB-SEM)
• Nuclear Magnetic Resonance (NMR) Spectrometers
• Electron Paramagnetic Resonance (EPR) Spectrometers
• BET Surface Area Analyzers
• And more solutions for scientific research and industrial applications

We look forward to connecting with researchers, partners, and customers from across Africa and beyond. Join us in Johannesburg to discover how CIQTEK is empowering innovation through advanced technology!