CIQTEK, a leading manufacturer and supplier of advanced Electron Paramagnetic Resonance (EPR) instrumentation, will host the "Symposium on Cutting-Edge Technology Applications of EPR – Focus on High-Frequency and High-Field EPR Technology and Complex System Analysis" in Hefei, China.

The event will bring together international researchers, instrument scientists, and application experts to explore the latest developments in high-field EPR, high-frequency EPR spectroscopy, and complex system analysis.

Event Details

• Date: March 31, 2026
• Location: CIQTEK Co., Ltd., No. 1969, Kongquetai Road, High-tech Zone, Hefei, Anhui, China

Advancing High-Field EPR for Complex Research Challenges

As research moves toward increasingly complex biological and material systems, high-frequency and high-field EPR technologies are becoming essential tools for improving spectral resolution, sensitivity, and structural insight.

This symposium will focus on how advanced EPR methods enable:

• Structural analysis of biological macromolecules and protein aggregation
• Investigation of spin dynamics and quantum systems
• Characterization of energy materials such as batteries
• Improved experimental accuracy through advanced instrumentation and data processing

By addressing real experimental challenges, the event aims to support researchers in generating more reliable and high-quality EPR data.

International Expert Insights Across Academia and Industry

The symposium will feature a series of technical presentations from leading experts across academia and industry, covering both fundamental research and practical EPR applications.

Key topics include:

• Next-generation X-, Q-, and W-band EPR instrumentation
• AI-enhanced spectral analysis and data interpretation
• EPR studies of tau protein aggregation and biomolecular structures
• EPR imaging techniques for battery research
• Ultra-low temperature systems for advanced spectroscopy

The speaker lineup includes researchers from globally recognized institutions such as Peking University, Tsinghua University, and the French National Centre for Scientific Research (CNRS), highlighting the international scope of the event.

Connecting EPR Users with Instrument Innovation

In addition to scientific sessions, the symposium will provide opportunities for direct interaction between EPR users and instrument developers.

Participants will benefit from:

• In-depth discussions on EPR system optimization and experimental workflows
• Insights into the latest advances in EPR instrument design and performance
• A guided visit to the CIQTEK Scientific Instrument Exhibition Center and Application Center

These activities are designed to bridge the gap between application needs and instrument development, enabling more efficient and targeted research.

Symposium Agenda

Visit the CIQTEK team to explore our advanced portfolio of EPR (ESR) and NMR spectrometers. Our application specialists will be on-site to discuss how CIQTEK’s precision measurement technologies support complex research in materials science, chemistry, and life sciences.

Don’t Miss Our Talk

Join our Magnetic Resonance Solution Manager, Dr. Jeff Sun, for a 10-minute presentation on the future of EPR spectroscopy:

• Topic: Next-Generation EPR: Combining High-Performance Q-Band Instrumentation with Artificial Intelligence Enhanced Spectral Processing

• Highlight: Learn how CIQTEK integrates high-frequency Q-Band hardware with AI algorithms to revolutionize spectral resolution and data efficiency.

We look forward to connecting with the magnetic resonance communities of France, Belgium, the Netherlands, and Luxembourg.

For inquiries, visit www.ciqtekglobal.com or contact info@ciqtek.com.

CIQTEK is rapidly expanding its global service network. At SCANDEM 2026, our European team will provide direct expertise to the Nordic research community. We are committed to delivering responsive and professional support across borders—from installation to specialized application development—ensuring scientific excellence for our partners in Northern Europe.

The 2026 Münster SEM training courses concluded with outstanding success, with the CIQTEK SEM3200 becoming one of the most talked-about systems during the hands-on sessions.

Throughout the program, many participants were able to operate the microscope almost immediately, often without prior introduction. The system's intuitive interface, ease of use, and strong imaging performance left a clear and lasting impression on attendees.

Hands-On Experience That Stood Out

From March 16 to March 20, the CIQTEK SEM3200 tungsten filament scanning electron microscope was actively used during the training sessions in Münster, Germany.

Unlike traditional demonstrations, the focus here was real hands-on use. Participants were encouraged to directly operate the system, explore settings, and run their own samples.

What made the experience unique was how quickly users adapted to the instrument. In many cases, participants began operating the SEM3200 independently without needing step-by-step guidance. This immediate usability became one of the most frequently mentioned highlights during the course.

Strong Feedback from Real Users

During the sessions, feedback from participants was consistent and highly positive.

Many users described the SEM3200 as:

• Easy to operate, even for first-time users
• Equipped with a clean and intuitive interface
• Capable of delivering clear, high-resolution images
• Offering a well-rounded and practical feature set

Several attendees expressed genuine surprise at how quickly they could get started and achieve meaningful results. For experienced microscopy users, the system’s workflow efficiency and responsiveness stood out. For newer users, the simplicity of operation significantly lowered the learning curve.

Real Samples, Real Results

A wide range of real-world samples were tested during the training sessions, including:

• Macrophage cells
• Alloy materials

These live experiments allowed participants to evaluate the SEM3200 in practical scenarios rather than controlled demos.

The results consistently impressed users. High-quality imaging, stable performance, and flexible operation enabled participants to quickly obtain useful data. Many attendees commented that the system exceeded their expectations, especially in terms of image clarity and overall usability.

About the Münster SEM Training Courses

The Münster SEM training courses are organized by the Akademie für Elektronenmikroskopie und Analytik gGmbH, a well-established institution focused on electron microscopy and microanalysis.

These long-running courses attract researchers, engineers, and industry users from across Europe. The program combines lectures with hands-on sessions, covering SEM fundamentals, advanced techniques, EDS analysis, and practical workflows.

Held at Münster University of Applied Sciences, the courses provide participants with direct access to multiple microscope systems and real-world training experience.

Supporting Practical Learning in Electron Microscopy

CIQTEK's participation in the Münster training courses reflects its ongoing commitment to supporting education and knowledge sharing in the microscopy community.

Hands-on training plays a critical role in helping users build confidence and develop practical skills. By providing access to modern instruments like the SEM3200, participants can better understand how SEM technology fits into real analytical workflows.

Events like this also create valuable opportunities for direct interaction between users and instrument developers. Feedback collected during training sessions helps improve usability, software design, and application performance.

CIQTEK SEM Portfolio

The SEM3200 is part of CIQTEK's expanding electron microscopy portfolio, designed for research institutions, universities, and industrial laboratories.

The product lineup includes:

• Tungsten Filament SEM
  Reliable and cost-effective systems for routine analysis
• Field Emission SEM
  High-resolution solutions for advanced research
• FIB-SEM Systems
  Dual-beam platforms for nanoscale analysis and sample preparation

A Strong Impression That Lasts

The 2026 Münster SEM training courses once again brought together the microscopy community for intensive learning and exchange.

CIQTEK is pleased that the SEM3200 played an active role in the program. The strong user feedback and hands-on success highlight the system's ability to deliver both performance and usability in real-world environments.

For many participants, this was not just another instrument demonstration, but a memorable first experience with a system that proved to be powerful, practical, and easy to use.

CIQTEK U.S. Team: Localized Expertise and Support

Strategic Significance: Academic Engagement and Regional Growth

Focus on Scanning Electron Microscopy (SEM) Technology

       

CIQTEK participated in the TMS 2026 Annual Meeting & Exhibition, held from March 15–19, 2026 in San Diego, California, USA. Our U.S. team and local distribution partner welcomed visitors at Booth #307, where we presented our latest electron microscopy solutions for materials science applications.

About TMS 2026

Organized by The Minerals, Metals & Materials Society (TMS), this annual meeting is a key event for the global materials science community. It brings together researchers, engineers, and industry professionals working in areas such as metallurgy, advanced materials, additive manufacturing, and characterization technologies.

The event provides a strong platform for exchanging ideas, discovering new technologies, and discussing real-world challenges in materials research and production.

Tailored SEM Solutions for Materials Research

CIQTEK showcased electron microscopy solutions designed to support a wide range of materials science applications.

Our systems are well-suited for:

• Microstructure analysis of metals and alloys

• Failure analysis and defect investigation

• Powder and particle characterization

• Additive manufacturing and new materials research

Many visitors were particularly interested in how CIQTEK systems deliver stable imaging performance while remaining easy to operate. For labs balancing performance, usability, and budget, this combination is especially important.

We also had in-depth discussions with users about their daily challenges, such as improving imaging efficiency, simplifying workflows, and handling complex samples. These conversations help us better align our solutions with real application needs.

Strong Local Presence and Support in the U.S.

Participation in TMS 2026 is part of CIQTEK's broader strategy to expand its electron microscopy business in the U.S. market.

We offer:

• A U.S.-based demo center for hands-on evaluation

• U.S. Local technical and application support

• Faster response for service and training

We continue to invest in local teams, infrastructure, and partnerships to support researchers and industry users better. By combining competitive technology with localized service, CIQTEK aims to make high-quality electron microscopy more accessible across North America.

Contact our U.S. team directly: info.usa@ciqtek.com

At CIQTEK, we believe that high-end scientific instruments are only as powerful as the hands that operate them. Recently, our Customer Success team visited the Integrated Circuit Experiment Center at USTC. Our mission was simple: to take the complexity out of Scanning Electron Microscopy (SEM) and provide researchers with the practical skills they need to push the boundaries of micro-scale observation.

This "Service-First" initiative brought together about 60 students and faculty members for a deep dive into the world of precision microscopy.

Moving from Theory to Mastery

A great experiment starts with a solid understanding of the "why" behind the "how." The training was structured into a dual-track model: comprehensive theory followed by intensive group practice.

In the classroom, our Customer Success Manager, Zhang Jing, broke down complex concepts into easy-to-digest insights. The sessions covered everything from the basic physics of electron beams to advanced parameter optimization.

Specifically, we focused on:

• The Fundamentals: How SEM works and its core functional applications.

• Optimization: Tweaking key parameters to get the sharpest possible data.

• Semiconductor Focus: Specific characterization techniques tailored for integrated circuit research.

By simplifying the "hardcore" technical knowledge, we ensured every participant had a rock-solid foundation before they ever touched the equipment.

Hands-on Teaching with a Human Touch

The real magic happened during the practical sessions. We know that reading a manual is never the same as actually running a scan. That is why our team moved into the lab for "shoulder-to-shoulder" teaching.

During the small-group workshops, we guided participants through the entire workflow:

1. 1. Sample Preparation: The crucial first step for any successful scan.

   2. Machine Operation: Getting comfortable with the CIQTEK hardware interface.

   3. Image Analysis: Learning how to interpret what you are seeing.

   4. Troubleshooting: Identifying and fixing common issues on the fly.

This one-on-one approach meant we could correct mistakes in real-time and answer specific questions as they popped up. The result? A noticeable jump in operating efficiency and a lot of happy researchers who now feel confident working with our instruments.

A Full-Cycle Commitment to Your Research

CIQTEK’s roots are in the academic world, and we feel a deep responsibility to give back to the scientific community. Our philosophy is built on "Achieving Customer Success." For us, the relationship does not end when an instrument is delivered; that is just where it begins.

We provide a full-spectrum service to protect your research journey:

• Smooth Delivery: Getting your equipment set up and ready to run.

• Deep Training: Ensuring your team has the skills to get the best results.

• Daily Maintenance: Keeping the hardware in peak condition.

• Ongoing Technical Support: We are just a call or email away when you hit a roadblock.

By providing this end-to-end support, CIQTEK is proud to safeguard the innovations happening in university labs and support the next generation of semiconductor and integrated circuit research.

Looking Ahead

While this two-day session has come to an end, our journey with the research community never stops. CIQTEK will continue to listen to user needs and provide the professional, attentive service that scientists deserve. We want our electron microscopes to be more than just tools; we want them to be reliable partners on your path to discovery.

Whether you are exploring the micro-world or breaking the boundaries of materials science, we are right there with you.

At booth #1113, the CIQTEK team presented its latest solutions in electron microscopy, NMR and EPR spectroscopy, and gas adsorption analysis, drawing strong interest from visitors working in materials science, chemistry, and advanced research.

Supported by the CIQTEK U.S. team and local distribution partners, the booth provided a welcoming space for in-depth technical discussions and live demonstrations. Many visitors stopped by to learn more about CIQTEK instruments and explore how these technologies can support their research projects.

Showcasing CIQTEK Electron Microscopy

Electron microscopy was one of the key highlights at the CIQTEK booth. Visitors had the opportunity to learn about CIQTEK electron microscopy (SEM/FIB, TEM) solutions, designed to provide reliable high-resolution imaging for a wide range of applications.

Researchers from universities and research laboratories were particularly interested in how CIQTEK SEM systems can support materials characterization, nanostructure analysis, and semiconductor research. The CIQTEK team shared real application examples and discussed how stable imaging performance and user-friendly operation can help laboratories obtain high-quality results more efficiently.

NMR and EPR Spectroscopy for Modern Research

CIQTEK also introduced its portfolio of Nuclear Magnetic Resonance (NMR) and Electron Paramagnetic Resonance (EPR) spectrometers, which attracted strong interest from scientists in chemistry, catalysis, and materials research.

Many visitors were interested in CIQTEK benchtop EPR solutions, designed to make EPR spectroscopy more accessible to laboratories seeking compact systems with strong performance. Discussions at the booth covered a range of applications, including studies of free radicals, transition metal ions, and material defects.

Surface and Porosity Analysis

In addition to electron microscopy and EPR, CIQTEK presented its gas adsorption analyzers for surface area and pore structure characterization. These instruments are widely used in research areas such as catalysts, energy materials, porous materials, and environmental science.

Visitors were interested in discussing measurement workflows, data interpretation, and how gas adsorption techniques can complement other characterization methods in materials research.

Strengthening Connections in North America

With support from the CIQTEK U.S. team and local partners, CIQTEK continues to expand its presence in the North American market and provide responsive technical support to customers!

Contact our USA team: info.usa@ciqtek.com

At the event, the CIQTEK Electron Microscopy EU team will introduce its scanning electron microscopy (SEM) and field emission SEM (FE-SEM) systems, highlighting applications in materials science, nanotechnology, semiconductor research, and life sciences. Participants can learn about CIQTEK's high-performance, reliable, and user-friendly electron microscopes designed to meet diverse research needs.

In addition, Dr. Fengfa Yao, senior EM solution scientist from the CIQTEK EU Electron Microscopy team, will deliver a technical presentation titled "Unlocking the Power of Unique High-Speed Scanning Electron Microscopy with No Compromise of Superb Imaging Resolution at Low kV for Large Scale Volume Microscopy Applications from CIQTEK." The talk will introduce CIQTEK's latest advancements in high-speed SEM imaging, demonstrating how researchers can achieve rapid data acquisition while maintaining excellent low-kV imaging resolution, which is critical for large-scale volume microscopy applications.

Dedicated DACH Region Support

To better serve European clients, CIQTEK has established and is expanding its dedicated DACH region (Germany, Austria, Switzerland) Electron Microscopy team, providing localized sales, technical support, and service. This ensures rapid response and tailored solutions for research institutes and laboratories across the region.

Event Information

• Event: 16th ASEM Workshop on Advanced Electron Microscopy

• Date: April 20–21, 2026

• Location: Institute of Science and Technology Austria (ISTA), Klosterneuburg, Austria

CIQTEK is pleased to announce that the CIQTEK SEM3200 tungsten filament scanning electron microscope will take part in the 2026 Münster SEM training courses, providing hands-on instrument experience for participants during the sessions held from March 16 to March 20, 2026 in Münster, Germany.

This collaboration allows researchers, engineers, and microscopy users attending the training program to directly operate the SEM3200 system and explore its capabilities in real-world analytical workflows. For many participants, it will be an opportunity to gain practical experience with modern scanning electron microscope technology during one of Europe’s longest-running microscopy training programs.

About the Münster SEM Training Courses

The SEM training courses in Münster are organized by the Akademie für Elektronenmikroskopie und Analytik gGmbH, a well-established institution dedicated to education in electron microscopy and microanalysis.

For decades, the academy has hosted intensive training sessions covering topics such as:

• Scanning Electron Microscopy Fundamentals

• Energy Dispersive Spectroscopy (EDS) analysis

• Electron imaging techniques

• Sample preparation and practical workflows

• Data interpretation for materials analysis

These courses attract a diverse group of participants each year. Attendees include university researchers, laboratory engineers, industrial materials specialists, and microscopy facility staff from across Europe and beyond.

The training takes place at the Fachhochschulzentrum of Münster University of Applied Sciences, where lecture sessions are combined with hands-on laboratory work. Multiple microscopes are installed for the courses so that participants can gain direct operational experience.

The 2026 course schedule includes several specialized sessions, such as:

• R-1: Introduction to Scanning Electron Microscopy

• R-2: Advanced SEM and Microanalysis

• R-3: Advanced SEM Techniques

• EBSD Analysis Training

• Particle Analysis Courses

During the sessions from March 16 to March 20, the CIQTEK SEM3200 will be available as one of the instruments used for training and demonstrations.

Check the courses here: http://www.akademie-elektronenmikroskopie.de/uebersicht.php

Supporting Education and Knowledge Sharing in Electron Microscopy

Training programs like the Münster SEM courses play an important role in the electron microscopy community. They provide a platform where researchers and engineers can strengthen their practical skills and exchange experiences with instructors and fellow participants.

CIQTEK believes that hands-on education is essential for advancing scientific research and analytical capabilities. By supporting training initiatives and providing instruments for practical sessions, the company aims to help users gain a deeper familiarity with SEM technology and its applications.

Events like these also create opportunities for dialogue between instrument developers and end users. Feedback from training environments often helps drive improvements in usability, software design, and analytical workflows.

CIQTEK Electron Microscopy Product Portfolio

The SEM3200 is part of CIQTEK's growing portfolio of electron microscopy instruments designed for research laboratories, universities, and industrial analytical facilities.

CIQTEK offers a range of scanning electron microscope solutions, including:

- Tungsten Filament SEM Series

Reliable and cost-effective systems for routine imaging and materials analysis.

- Field Emission SEM Series

High-resolution instruments designed for advanced nanostructure observation and demanding research applications.

- Focused Ion Beam SEM (FIB-SEM)

Dual-beam systems for nanoscale sample preparation, cross-sectioning, and 3D analysis.

Looking Ahead to Münster 2026

The 2026 Münster SEM training courses will once again bring together members of the microscopy community for several weeks of intensive learning and practical experience. CIQTEK is pleased that the SEM3200 scanning electron microscope will contribute to the program and support participants during their hands-on sessions.

By working with training institutions and research organizations, CIQTEK continues to support the development of microscopy expertise and the advancement of materials characterization technologies worldwide.