Four-dimensional scanning transmission electron microscopy (4D-STEM) is one of the most cutting-edge directions in electron microscopy. By performing a two-dimensional scan across the sample surface while recording a full diffraction pattern at each scan point with a pixelated detector, 4D-STEM generates a four-dimensional dataset containing both real-space and reciprocal-space information.

This technique breaks through the limitations of conventional electron microscopy that typically collects only a single scattering signal. Instead, it captures and analyzes the entire spectrum of electron–sample interactions. With 4D-STEM, researchers can achieve multiple advanced functionalities within a single experiment, including virtual imaging, crystal orientation and strain mapping, electric and magnetic field distribution analysis (differential phase contrast), and even atomic-resolution reconstruction through diffraction stacking. It greatly expands the dimensionality and depth of materials characterization, offering an unprecedented tool for nanoscience and materials research.

 

At the Chinese National Conference on Electron Microscopy 2025 (Sept 26–30, Wuhan), CIQTEK releases its 4D-STEM solution, designed to break through the boundaries of traditional imaging and deliver data with unmatched dimensionality and analytical power.

 

System Workflow

 

The CIQTEK 4D-STEM solution features high spatial resolution, multi-dimensional analysis, low-dose operation to minimize beam damage, and flexible data processing, providing researchers with reliable and outstanding methods for advanced materials analysis.

Research on the microscopic behavior of materials is entering a new era of multi-scenario coupling and in-situ dynamic characterization. CIQTEK has launched an innovative In-situ Mechanical Testing Solution, designed with outstanding openness and compatibility. It enables seamless integration of CIQTEK’s full range of electron microscopes with mainstream in-situ testing devices, providing a flexible and efficient platform for coupled analysis in diverse research scenarios.

 

Breaking the limitations of closed systems, the solution integrates all critical elements required for in-situ EM adaptability, featuring:

• High beam current: >100 nA, ideal for fast EDS/EBSD analysis

• Large space: 360 × 310 × 288 mm (L × W × H)

• High load capacity: 5 kg (up to 10 kg with custom fixtures)

• Multi-view CCDs: ensuring system safety during in-situ operation

• Multiple interfaces: supporting customized flange accessories

• Pre-acceptance: full accessory debugging before delivery, ensuring complete functionality without on-site installation issues

The solution can be configured across CIQTEK’s full range of electron microscopy products, including CIQTEK SEM3200, SEM5000X, DB550 dual-beam systems, and more. It also offers seamless compatibility with tensile stages, heating stages, nanoindenters, and electrochemical workstations from world-leading suppliers. This open architecture enables researchers to flexibly combine the most suitable equipment, maximizing experimental performance.

 

CIQTEK’s in-situ stage solution supported customers in publishing a high-impact paper (DOI: 10.1126/science.adq6807).

 

CIQTEK’s In-situ Mechanical Solution also supports multi-field coupling (mechanical, thermal, electrochemical), enabling nanoscale real-time observation of materials under complex environments. By synchronizing high-resolution imaging with in-situ signals, researchers can capture critical phenomena such as crack propagation, phase transitions, and interfacial reactions with precision.

With a temperature range of -170 to 1200 °C, advanced load control, and rapid response systems, it accurately simulates service conditions of materials across various industries. Combined with EBSD and EDS, it provides comprehensive datasets for understanding material behavior under coupled stimuli.

 

Successfully applied in aerospace materials, new energy devices, and biomedical materials, this solution demonstrates CIQTEK’s exceptional compatibility and scalability in advanced electron microscopy platforms.

In life sciences, achieving high-precision and large-scale 3D structural and dynamic analysis of biological samples such as cells and tissues has become key to breaking through research bottlenecks. CIQTEK has introduced a multi-technology-route Volumetric Electron Microscopy (VEM) solution, integrating SS-SEM, SBF-SEM, and FIB-SEM. This provides an all-around, high-performance, and intelligent platform for biological 3D reconstruction, helping researchers uncover the micro-level mysteries of life.

 

Three Advanced Technical Routes

01. SS-SEM High-Speed Imaging
By combining external serial sectioning with the CIQTEK high-speed HEM6000-Bio SEM, this solution enables rapid imaging and automated acquisition of large-volume samples. Data acquisition efficiency is more than 5× higher than conventional SEM, supporting 24/7 unattended high-throughput operation.

 

02. SBF-SEM In-Situ Sectioning
Based on the CIQTEK ultra-high-resolution SEM5000X with an integrated microtome, this approach achieves in-situ sectioning and imaging cycles. It offers simple operation, high automation, and effectively avoids surface contamination.

 

03. FIB-SEM High-Precision Analysis
Leveraging focused ion beam–electron beam dual-beam systems, this route delivers nanoscale Z-axis resolution to analyze fine structures such as organelles and membranes. It enables in-situ 3D reconstruction without physical slicing.

 

Intelligent Integration & Broad Applications

The CIQTEK VEM solution deeply integrates AI algorithms and a multilingual software platform, supporting a full workflow from data acquisition, image alignment, and segmentation to 3D visualization. Compatible with mainstream reconstruction software, it significantly lowers the learning curve.

 

Application cases span neuroscience, cell biology, and pathogenic microbiology, offering a powerful tool for advancing life science research.

As semiconductor manufacturing advances to finer process nodes, wafer-level defect analysis, failure location, and micro-nano fabrication have become key to improving yield. CIQTEK introduces the 8-inch Wafer Dual-Beam Full-Size Processing Solution, combining high-resolution imaging and precise ion beam processing to achieve "observation-analysis-cutting" across the entire wafer, providing strong technical support for advanced semiconductor processes.

 

This solution features a 150mm long-stroke high-precision sample stage, enabling full-wafer, non-destructive observation and processing of 8-inch wafers. With an external optical navigation system and intelligent anti-collision algorithms, it ensures rapid and precise wafer positioning and safe operation. The system is equipped with a Schottky field emission electron gun, offering a resolution of 0.9 nm @ 15kV, and an ion beam resolution of 3 nm @ 30kV, capable of defect detection, cross-section slicing, and micro-structure fabrication at the nanoscale.

 

Core Advantages:

• 150mm Travel Stage:

• • Combines long travel with high precision for an extensive observation range.

  • Excellent compatibility with different-sized fixtures.

  • Robust structure ensures wafer stability and quick, reliable loading.

• 8-inch Quick Exchange:

  • Intelligent weight-bearing design with a sliding base for stability and durability.

  • Full-size compatibility: Supports 2/4/6/8-inch wafers.

  • Fast sample exchange: Vacuum pumping and sample loading within one minute.

• Software and Anti-Collision:

• • Fully automatic intelligent navigation with accurate movement and positioning.

  • Multi-axis coordinated motion for full-wafer observation.

  • Smart anti-collision: Trajectory simulation and algorithmic spatial calculations to avoid risks.

  • Multiple real-time monitoring: Real-time multi-angle monitoring of wafer position.

• External Optical Navigation:

  • Ultra-stable structure design suppresses image shake.

  • High-definition imaging with a precise field of view for full-wafer display.

  • Professional anti-glare lighting reduces wafer surface reflection.

 

Wafer observation range

 

CIQTEK Dual-Beam Electron Microscope Solution combines outstanding hardware with intelligent software systems, enabling efficient defect detection and process optimization through one-click brightness and contrast adjustment, auto-focus, and multi-format image output, empowering users to complete the full chain of tasks from defect discovery to process optimization.

Palm Vein Scanner swiping technology, a cutting-edge biometric technology, provides comprehensive support for identity verification. Based on a proprietary multimodal palm swiping camera and paired with SFT biometric algorithms, palm swiping technology significantly improves the security and efficiency of identity verification, enabling rapid authentication and permission management in all scenarios. Furthermore, the contactless service provided by this technology effectively reduces the risk of contact transmission, improves public health and safety, and provides a superior user experience.

 

Palm Prints scanner in Transportation:

 Airport Line

China's first subway line to feature palm-swipe payment ushers in a new era of "contactless travel."

The implementation of the palm-swipe system on the Daxing Airport Line marks the official entry of rail transit into the biometric 3.0 era. Palm-swipe biometric technology redefines subway travel and ushers in a new era of "contactless travel" in smart transportation. This not only significantly improves passenger travel efficiency but also promotes the deep integration of artificial intelligence technology in public services.

 

 

Wireless Palm vein swiping module used  in Stadium:

 

Swimming Pool

"One-Palm Access": China's first large-scale sports venue full-scene palm scanning application demonstration project

The  Swimming Pool of the National Olympic Center has officially launched its "Palm Scan Access" system. Leveraging innovative multimodal biometric technology, this system redefines the sports and fitness experience, offering contactless access throughout the entire experience with just one palm, creating a new model for smart sports venue services.

 

Gym

Palm Check-in: A New Smart Fitness Experience

Gym's palm check-in marks the first application of palm-scanning biometrics in the fitness industry. Leveraging multimodal biometric technology, it enables contactless, ultra-fast identity verification, effectively addressing issues such as card fraud, long queues, and unsanitary conditions associated with traditional QR code check-in.

 

Palm vein Payment Reader in Retailing:

 

 

 7-Eleven Convenience Stores

Over 1,500 stores now support palm payment, offering a new "swipe and pay" experience.

As one of the first convenience store brands nationwide to support WeChat palm payment, over 1,500 7-Eleven stores now support palm payment. This feature uses palm biometric recognition technology for contactless checkout, improving overall efficiency, further reducing queues, and accelerating the intelligent upgrade of retail services.

 

 

Contactless Palm vein scanner in Schools:

University

China's first university "Campus One-Person Pass" system

Shenzhen University's "Campus One-Person Pass" system uses palm-swipe biometric technology to provide a secure, contactless authentication experience. After users first enter their palm print on a palm-swipe device and link it to their WeChat campus code, they can pay instantly in cafeterias, convenience stores, and other locations, without the need for a phone or physical card.

 

Biometric Palm Vein scanner in Shared charging

Jiedian

1-second identification, 2-step operation, 5-second delivery

 

Jiedian's palm-swipe charging service revolutionizes shared charging services with biometric recognition technology. Leveraging cutting-edge multimodal biometrics, it quickly and accurately completes the identification process, further addressing traditional shared charging pain points such as dead phones or poor signal quality, delivering a superior shared charging experience.

In the fields of high-temperature material performance research and phase transition mechanism analysis, traditional external heating methods often fail to combine precise micro-region temperature control with real-time observation.

 

CIQTEK, in collaboration with the Micro-Nano Center of the University of Science and Technology of China, has developed an innovative in-situ heating chip solution. By integrating MEMS heating chips with dual-beam electron microscopes, this solution enables precise temperature control (from room temperature to 1100°C) and micro-dynamic analysis of samples, offering a new tool for studying material behavior in high-temperature environments.

This solution uses the CIQTEK dual-beam SEM and specialized MEMS heating chips, with temperature control accuracy better than 0.1°C and temperature resolution better than 0.1°C. The system also features excellent temperature uniformity and low infrared radiation, ensuring stable analysis at high temperatures. The system supports various characterization techniques during heating, including micro-region morphology observation, EBSD crystal orientation analysis, and EDS composition analysis. This allows for a comprehensive understanding of phase transitions, stress evolution, and composition migration under thermal effects.

 

The system operates without breaking the vacuum, fulfilling the full process requirements for sample preparation and characterization (in-situ micro-region EBSD).

 

The integrated workflow design covers the entire process, from sample preparation (ion beam processing, nano-manipulator extraction) to in-situ welding and heating tests. The system supports multi-angle operation, featuring a 45° heating chip and a 36° copper grid position, which meet the complex experimental needs. The system has been successfully applied in high-temperature performance research of alloys, ceramics, and semiconductors, helping users gain deeper insights into material responses in real-world environments.

 

 

 

September 26–30, Wuhan | 2025 Chinese National Conference on Electron Microscopy
CIQTEK's eight major electron microscopy solutions will be showcased!

Is your hotel constantly losing towels, sheets, and robes? Are your staff spending hours counting linen instead of helping guests? You're not alone. Linen loss is a multi-billion dollar problem for the hospitality industry. But what if you could turn invisible inventory into a smart, manageable asset?

The answer lies in RFID laundry tags, specifically rugged ones like our TT7015s. Here’s how they create a smarter, more profitable hotel operation:

1. Slash Inventory Shrinkage: With a unique ID on every item, you know exactly what you have and where it is. Suddenly, those "lost" pool towels magically reappear. This direct loss prevention can save thousands per year.

2. Eliminate Manual Counting: Imagine doing a full inventory of your laundry room in under a minute. With a handheld UHF RFID reader, your staff can scan an entire cart without moving a single sheet, freeing them for guest-facing tasks.

3. Extend Linen Lifespan: The TT7015s is built to last over 200 washes. By tracking wash cycles, you can retire items before they become threadbare and ruin your guest experience, optimizing your purchasing budget.

4. Streamline Laundry Workflow: Automate the sorting process. Clean items can be automatically sorted by type and destination (e.g., "Spa Towels," "King Bed Sheets"), drastically reducing labor costs and speeding up turnaround.

5. Data-Driven Decisions: How many times does a sheet typically get used before it's replaced? Now you have the data. Make smarter purchasing decisions, negotiate better with suppliers, and finally prove your ROI on linen spend.

Implementing RFID for hotel linen management isn't just about technology; it's about empowering your team, impressing your guests with flawless service, and protecting your bottom line. It’s a simple stitch that strengthens your entire operation.

The IOTE 2025 Expo in Shenzhen was a whirlwind of RFID and IoT innovation.  While the exhibition halls buzzed with the latest hardware, the true pulse of strategic collaboration often beats in the conference rooms alongside such mega-events.

 

The WAIA (World AIoT Innovation Alliance) Summit on August 27th offered precisely this invaluable platform.  Focusing on "Global AIoT Market Trends & Strategic Collaboration," the summit gathered international AIoT association leaders, operators, and researchers.  The agenda was rich with insights into regional market trends, featured project releases, and best practice case studies crucial for anyone invested in the future of Intelligent Connectivity.

A key highlight was the panel discussion on "AIoT Innovation Across Regions & Industries," addressing pressing trends, challenges, and opportunities.  The subsequent launch of the WAIA Global AIoT Expert Group and the signing of MoUs underscored a collective drive towards a more integrated global AIoT ecosystem.

 

For companies like ours, SeeMore IoT, which focuses on precision-engineered RFID hardware solutions for Industrial IoT, smart retail, and logistics, events like the WAIA Summit are indispensable.  It’s where we move beyond mere transactions to form the strategic partnerships essential for navigating the complex landscape of digital transformation.  The exclusive networking cocktail reception was particularly fruitful for connecting with fellow pioneers and discussing real-world applications of RFID in smart parking, asset tracking, and supply chain management.

 

Keywords: WAIA Summit 2025, AIoT ecosystem, global AIoT collaboration, IoT market trends, strategic partnerships in IoT, Industrial IoT solutions, intelligent connectivity, RFID hardware solutions, smart parking RFID, digital transformation partner

The recent integration of Impinj Gen2X technology into Avery Dennison’s RFID inlays is more than an upgrade—it’s a game-changer. For businesses struggling with inaccuracy, slow scans, or high-loss environments, this collaboration offers a breakthrough.

What’s New?

Gen2X enhances RFID tag performance in three key ways:

• Speed: Scan thousands of items per second, even when stacked or hidden.

• Accuracy: Achieve 99.9% read rates despite metal or liquid interference.

• Cost-Efficiency: Smaller antenna designs lower tag costs, critical for high-volume applications.

Why It Matters for You

• Retailers: Simplify self-checkout and reduce theft with reliable item-level tracking.

• Logistics Managers: Track pallets or individual items in real time, eliminating manual errors.

• Food Suppliers: Cut waste with expiry-date monitoring and dynamic pricing.

The Bottom Line

Avery Dennison’s move makes advanced RFID stickers accessible to all. Whether you’re in retail, logistics, or food services, now is the time to explore Gen2X-powered RFID solutions for a smarter, more connected operation.

CIQTEK has introduced its next-generation 12-inch wafer scanning electron microscope (SEM) solution, designed to meet the demands of advanced semiconductor manufacturing processes. Offering full-wafer inspection without the need for rotation or tilting, this innovative solution ensures high-resolution, non-destructive analysis to support critical process development.

Equipped with an ultra-large travel stage (X/Y ≥ 300 mm), the system provides complete coverage of 12-inch wafers, eliminating the need for sample cutting or transfer. This ensures true "original size, original position" observation. With a Schottky field emission electron gun, it achieves a resolution of 1.0 nm at 15 kV and 1.5 nm at 1 kV, minimizing electron beam damage, making it ideal for sensitive materials and structures.

 

 

Key features include:

• Ultra-large travel stage (X/Y > 300 mm) for full-wafer inspection

• High-resolution imaging: 1.0 nm at 15 kV and 1.5 nm at 1 kV

• Automated loading and optical navigation system for fast wafer exchange and precise positioning

• Intelligent software for auto-focus, astigmatism correction, and multi-format image output

 

CIQTEK's 12-inch wafer inspection SEM is more than just an observation tool; it's a critical instrument driving higher yields and smaller nodes in semiconductor manufacturing.

 

September 26–30, Wuhan
CIQTEK will unveil eight cutting-edge electron microscopy solutions at the 2025 Chinese National Conference on Electron Microscopy!