At ESEM 2025, CIQTEK showcased its SEM product line, including FIBSEM, FESEM, and Tungsten Filament SEM. Our booth drew interest from both biological and materials science researchers, keen to see real-sample imaging, low-voltage performance, and analytical integration.

Beyond exhibits, CIQTEK representatives engaged in technical exchange, discussing how advanced SEM tools can bolster regional research infrastructure. We emphasized our commitment to delivering high-performing instruments, competitive pricing, and local support networks to facilitate adoption in diverse labs across the region.

Impact & Outlook

The conference underscored how microscopy continues to unveil the unseen—from cellular ultrastructure to nanomaterial phenomena. For many participants, this was a rare opportunity to access a wide spectrum of imaging techniques under one roof, and to converse directly with vendors like CIQTEK.

By engaging with local scientists and institutions, CIQTEK deepens its global reach and contributes to the growth of microscopy in underrepresented regions. We look forward to continuing our support in Africa and the Middle East through instrument installations, training, and responsive service.

CIQTEK is pleased to announce the successful installation and training of the FIBSEM DB550 at our Korean distributor GSEM’s Electron Microscope Center. This milestone marks an important step in expanding access to advanced focused ion beam scanning electron microscope (FIBSEM) technology in South Korea.

The DB550 combines high-resolution imaging with precise ion beam milling, enabling researchers to perform 3D reconstruction, cross-sectional analysis, and nanoscale material modification with efficiency and accuracy. With these capabilities, the system opens new possibilities for semiconductor analysis, materials science, and life science research.

Following installation, CIQTEK engineers provided hands-on training to the GSEM team, covering both standard workflows and advanced applications. The interactive sessions ensured that users gained practical experience in operating the instrument, from sample preparation to high-resolution imaging and data analysis. The enthusiasm and engagement of the GSEM team highlighted the strong potential for the DB550 to support diverse research projects at the center.

This collaboration reflects CIQTEK’s commitment to working closely with partners worldwide. By equipping GSEM’s facility with the DB550, we are not only strengthening our presence in the Korean market but also helping local researchers gain access to cutting-edge tools for scientific innovation.

We look forward to seeing the exciting results that GSEM’s Electron Microscope Center will achieve with the DB550, and we remain committed to providing ongoing technical support and collaboration.

From August 24–29, 2025, CIQTEK participated in the Microscopy Conference 2025 (MC2025) held in Karlsruhe, Germany, one of Europe’s largest and most influential events in the field of electron microscopy. The conference attracted leading scientists, instrument developers, and industrial users, creating a dynamic platform for academic exchange and technological collaboration.

As part of the program, CIQTEK delivered an Exhibitor Presentation titled:
“Unlocking the Power of High-Speed Scanning Electron Microscopy — without Compromising Superb Imaging Resolution at Low kV.”

The presentation highlighted CIQTEK’s approach to enabling high-throughput SEM imaging while maintaining exceptional resolution at low accelerating voltages—a balance critical for applications in materials science, semiconductor failure analysis, and life sciences research. The talk generated considerable interest among attendees and sparked lively discussions about how advanced SEM systems can accelerate both fundamental research and industrial applications.

Beyond the presentation, the CIQTEK team actively engaged with researchers and industry professionals, sharing insights into the company’s broader electron microscopy portfolio and exploring opportunities for collaboration. These exchanges not only deepened awareness of CIQTEK’s technological strengths but also strengthened connections within the global microscopy community.

CIQTEK’s successful participation in MC2025 reflects its ongoing mission to push the boundaries of EM imaging technology and to provide researchers worldwide with powerful, accessible, and innovative solutions. Looking ahead, the company will continue to expand international partnerships and contribute to the advancement of microscopy-driven discovery.

At the booth, our team engaged with a wide range of researchers and professionals from materials science, life science, and beyond. We showcased our latest innovations in high-performance field emission scanning electron microscopy (FESEM), with a focus on imaging speed, resolution, and user-friendly operation. The strong interest and positive feedback we received on-site reaffirmed the value of our technologies to the scientific community.

A key highlight of the event was our well-attended Vendor Tutorial, featuring CIQTEK electron microscopy expert Mr. Luke Ren. His presentation on high-speed FESEM (HEM) imaging sparked insightful discussions and active engagement from the audience. We were excited to see the high level of interest, and we sincerely thank everyone who participated and contributed to the success of this session.

We also extend our heartfelt thanks to our trusted U.S. distributor, JH Technologies, for their outstanding support throughout the event. Their professionalism and dedication played a crucial role in helping us connect with more users and partners nationwide. Together, we are building a stronger foundation for CIQTEK's long-term growth in North America.

M&M 2025 was not just a trade show; it was a meaningful step forward in our journey to bring cutting-edge electron microscopy solutions to more scientists and institutions. We are energized by the conversations and inspired by the collaborations, and we are already looking ahead to future opportunities.

We look forward to seeing you at M&M 2026 in Milwaukee!

At our booth, visitors will have the opportunity to explore CIQTEK’s latest developments in electron microscopy, including our next-generation SEM and FIB systems. Whether you’re seeking high-resolution imaging, intuitive operation, or reliable performance, our solutions are designed to meet the needs of both research and industrial users.

• FIB-SEM
• High Speed FESEM
• FE-SEM
• Tungsten SEM
• TEM

JH Technologies Booth #1403

Our trusted U.S. partner, JH Technologies, will also be exhibiting at Booth #1403, offering localized consultation, technical support, and insight into how CIQTEK products are serving laboratories across North America.

We look forward to meeting scientific professionals, collaborators, and microscopy enthusiasts in Salt Lake City to share insights, explore possibilities, and build lasting partnerships.

Save the date and visit us at MM2025!

Follow CIQTEK on LinkedIn for more updates and behind-the-scenes highlights from MM2025.