CIQTEK successfully concluded a dynamic and rewarding week at Microscopy & Microanalysis 2025 (M&M 2025), one of the most influential events in the global microscopy community. This marks another important milestone as we continue to expand our presence in the North American electron microscopy market.
At the booth, our team engaged with a wide range of researchers and professionals from materials science, life science, and beyond. We showcased our latest innovations in high-performance field emission scanning electron microscopy (FESEM), with a focus on imaging speed, resolution, and user-friendly operation. The strong interest and positive feedback we received on-site reaffirmed the value of our technologies to the scientific community.
A key highlight of the event was our well-attended Vendor Tutorial, featuring CIQTEK electron microscopy expert Mr. Luke Ren. His presentation on high-speed FESEM (HEM) imaging sparked insightful discussions and active engagement from the audience. We were excited to see the high level of interest, and we sincerely thank everyone who participated and contributed to the success of this session.
We also extend our heartfelt thanks to our trusted U.S. distributor, JH Technologies, for their outstanding support throughout the event. Their professionalism and dedication played a crucial role in helping us connect with more users and partners nationwide. Together, we are building a stronger foundation for CIQTEK's long-term growth in North America.
M&M 2025 was not just a trade show; it was a meaningful step forward in our journey to bring cutting-edge electron microscopy solutions to more scientists and institutions. We are energized by the conversations and inspired by the collaborations, and we are already looking ahead to future opportunities.
We look forward to seeing you at M&M 2026 in Milwaukee!
